Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity

by B. Affour, P. Mialhe
Published 1997-01-01

Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor

by N. Toufik, F. Pélanchon, P. Mialhe
Published 2001-01-01

Degradation of VDMOSFET by Heavy Ion Irradiations

by C. Salame, F. Pelanchon, P. Mialhe
Published 2000-01-01

Interfacial Dynamic Velocity for Solar Cell Characterization

by J. Farah, B. Azar, A. Khoury, P. Mialhe
Published 1997-01-01

A New Junction Parameters Determination Using the Double Exponential Model

by S. Dib, A. Khoury, F. PéLanchon, P. Mialhe
Published 2002-01-01

High Injection Effects on Solar Cell Performances

by P. Mialhe, B. Affour, K. El-Hajj, A. Khoury
Published 1995-01-01

Surface Recombination Via Interface Defects in Field Effect Transistors

by E. Bendada, K. Raïs, P. Mialhe, J. P. Charles
Published 1998-01-01

A New Method for the Extraction of Diode Parameters Using a Single Exponential Model

by S. Dib, M. De La Bardonnie, A. Khoury, F. Pelanchon, P. Mialhe
Published 2000-01-01

Junction Parameter Extraction for Electronic Device Characterization

by S. Dib, C. Salame, N. Toufik, A. Khoury, F. Pélanchon, P. Mialhe
Published 2004-01-01

Diode Parameter Determination Applied to LDD-MOSFETs for Device Characterization

by M. De La Bardonnie, P. Mialhe, E. Bendada, E. Blampain, A. Hoffmann, J.-P. Charles
Published 1998-01-01