Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor

by N. Toufik, F. Pélanchon, P. Mialhe
Published 2001-01-01

Degradation of VDMOSFET by Heavy Ion Irradiations

by C. Salame, F. Pelanchon, P. Mialhe
Published 2000-01-01

A New Junction Parameters Determination Using the Double Exponential Model

by S. Dib, A. Khoury, F. PéLanchon, P. Mialhe
Published 2002-01-01

A New Method for the Extraction of Diode Parameters Using a Single Exponential Model

by S. Dib, M. De La Bardonnie, A. Khoury, F. Pelanchon, P. Mialhe
Published 2000-01-01

Junction Parameter Extraction for Electronic Device Characterization

by S. Dib, C. Salame, N. Toufik, A. Khoury, F. Pélanchon, P. Mialhe
Published 2004-01-01