Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors

by E. Bendada, K. Raïs
Published 1998-01-01

Diode Physical Parameters for HEXFETs Characterization of Dose Effect

by E. Bendada, K. Raïs
Published 1998-01-01

A Physical Model for MOSFET Drain Current in Non-ohmic Regime Using Ohmic Regime Operation

by A. El Abbassi, Y. Amhouche, K. Raïs, R. Rmaily
Published 2001-01-01

Relaxable Damage in Hot-Carrier Stressing of n-MOS Transistors

by M. Rahmoun, E. Bendada, A. El Hassani, K. Raïs
Published 2000-01-01

Analysis of Temperature and Drain Voltage Dependence of Substrate Current in Deep Submicrometer MOSFET'S

by Y. Amhouche, A. El Abbassi, K. Raïs, R. Rmaily
Published 2001-01-01

An Accurate Method for Extracting the Critical Field in Short Channel NMOS Devices

by Y. Amhouche, A. El Abbassi, K. Raïs, R. Rmaily
Published 2001-01-01

Surface Recombination Via Interface Defects in Field Effect Transistors

by E. Bendada, K. Raïs, P. Mialhe, J. P. Charles
Published 1998-01-01

Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors

by A. El Abbassi, Y. Amhouche, E. Bendada, R. Rmaily, K. Raïs
Published 2001-01-01

New Method for Determination of Drain Saturation Voltage in Short Channel MOS Devices Between Liquid Helium to Room Temperature

by Y. Amhouche, A. El Abbassi, K. Raïs, E. Bendada, R. Rmaily
Published 2001-01-01

Design of High Gain Novel Dielectric Resonator Antenna Array for 24 GHz Short Range Radar Systems

by A. Haddad, M. Aoutoul, K. Rais, M. Essaaidi, M. Faqir, M. Bouya
Published 2018-08-01