Focused-ion-beam induced damage in thin films of complex oxide BiFeO3

by W. Siemons, C. Beekman, J. D. Fowlkes, N. Balke, J. Z. Tischler, R. Xu, W. Liu, C. M. Gonzales, J. D. Budai, H. M. Christen
Published 2014-02-01

Hidden Magnetic States Emergent Under Electric Field, In A Room Temperature Composite Magnetoelectric Multiferroic

by J. D. Clarkson, I. Fina, Z. Q. Liu, Y. Lee, J. Kim, C. Frontera, K. Cordero, S. Wisotzki, F. Sanchez, J. Sort, S. L. Hsu, C. Ko, L. Aballe, M. Foerster, J. Wu, H. M. Christen, J. T. Heron, D. G. Schlom, S. Salahuddin, N. Kioussis, J. Fontcuberta, X. Marti, R. Ramesh
Published 2017-11-01

Electrically reversible cracks in an intermetallic film controlled by an electric field

by Z. Q. Liu, J. H. Liu, M. D. Biegalski, J.-M. Hu, S. L. Shang, Y. Ji, J. M. Wang, S. L. Hsu, A. T. Wong, M. J. Cordill, B. Gludovatz, C. Marker, H. Yan, Z. X. Feng, L. You, M. W. Lin, T. Z. Ward, Z. K. Liu, C. B. Jiang, L. Q. Chen, R. O. Ritchie, H. M. Christen, R. Ramesh
Published 2018-01-01