Focused-ion-beam induced damage in thin films of complex oxide BiFeO3

by W. Siemons, C. Beekman, J. D. Fowlkes, N. Balke, J. Z. Tischler, R. Xu, W. Liu, C. M. Gonzales, J. D. Budai, H. M. Christen
Published 2014-02-01

Impact of gate geometry on ionic liquid gated ionotronic systems

by A. T. Wong, J. H. Noh, P. R. Pudasaini, B. Wolf, N. Balke, A. Herklotz, Y. Sharma, A. V. Haglund, S. Dai, D. Mandrus, P. D. Rack, T. Z. Ward
Published 2017-04-01