Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults

碩士 === 中原大學 === 電子工程研究所 === 102 === In this thesis,we change the internal structure of scan flip flops by adding four trigates and controlling them with two signals. Scan flip-flops can therefore have the ability of data gating[1] to restore original values or choose values from inputs. We partiton...

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Bibliographic Details
Main Authors:	Chang-Jung Ho, 何長融
Other Authors:	Hsing-Chung Liang
Format:	Others
Language:	zh-TW
Published:	2014
Online Access:	http://ndltd.ncl.edu.tw/handle/3a6y9v

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spelling	ndltd-TW-102CYCU54280272019-05-15T21:23:53Z http://ndltd.ncl.edu.tw/handle/3a6y9v Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults 低功率多掃描段測試架構之多功能控制電路設計 Chang-Jung Ho 何長融碩士中原大學電子工程研究所 102 In this thesis,we change the internal structure of scan flip flops by adding four trigates and controlling them with two signals. Scan flip-flops can therefore have the ability of data gating[1] to restore original values or choose values from inputs. We partiton scan chains into multiple segments and design controller circuits for providing control signals to make only one segment be active during shift, launch, and capture operations for LOC and LOS application for low-power testing transition delay faults. We use the method of Cherng-Wei Leu[13] for grouping flip-flops into segments and generating test patterns accordingly. Experiments show that our designs and testing methods can help achieve the purpose of low-power testing of transition delay faults. Hsing-Chung Liang 梁新聰 2014 學位論文 ; thesis 70 zh-TW
collection	NDLTD
language	zh-TW
format	Others
sources	NDLTD
description	碩士 === 中原大學 === 電子工程研究所 === 102 === In this thesis,we change the internal structure of scan flip flops by adding four trigates and controlling them with two signals. Scan flip-flops can therefore have the ability of data gating[1] to restore original values or choose values from inputs. We partiton scan chains into multiple segments and design controller circuits for providing control signals to make only one segment be active during shift, launch, and capture operations for LOC and LOS application for low-power testing transition delay faults. We use the method of Cherng-Wei Leu[13] for grouping flip-flops into segments and generating test patterns accordingly. Experiments show that our designs and testing methods can help achieve the purpose of low-power testing of transition delay faults.
author2	Hsing-Chung Liang
author_facet	Hsing-Chung Liang Chang-Jung Ho 何長融
author	Chang-Jung Ho 何長融
spellingShingle	Chang-Jung Ho 何長融 Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
author_sort	Chang-Jung Ho
title	Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
title_short	Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
title_full	Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
title_fullStr	Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
title_full_unstemmed	Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
title_sort	multi-function controller for low-power multiple scan test of transition delay faults
publishDate	2014
url	http://ndltd.ncl.edu.tw/handle/3a6y9v
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Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults

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