Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
碩士 === 中原大學 === 電子工程研究所 === 102 === In this thesis,we change the internal structure of scan flip flops by adding four trigates and controlling them with two signals. Scan flip-flops can therefore have the ability of data gating[1] to restore original values or choose values from inputs. We partiton...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3a6y9v |