Showing 1 - 20 results of 22 for search 'Hsing-Chung Liang', query time: 0.13s Refine Results
  1. 1
    Reducing Edges Among Flip-Flop Groups To Generate Diverse Launch-Off-Capture Patterns
    by Jin-Wei Li, 李勁緯
    Published 2018
    Other Authors: “...Hsing-Chung Liang...”
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  2. 2
    A New Pixel Design for VA Mode LCD Color Washout Improvement
    by Chin-Hai Huang, 黃金海
    Published 2011
    Other Authors: “...Hsing-Chung Liang...”
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  3. 3
    Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
    by Chang-Jung Ho, 何長融
    Published 2014
    Other Authors: “...Hsing-Chung Liang...”
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  4. 4
    Flip-Flop Grouping and Controlling for Low Power Test Patterns of Transition Delay Faults
    by Cherng-Wei Leu, 呂承韋
    Published 2014
    Other Authors: “...Hsing-Chung Liang...”
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  5. 5
    Sorting Patterns for Low-Power Multi-Chain Test
    by Zhe-Wei Lu, 盧哲偉
    Published 2014
    Other Authors: “...Hsing-Chung Liang...”
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  6. 6
    DRAM Repair algorithm methodology extension
    by Chang-Ming Liu, 劉昌明
    Published 2005
    Other Authors: “...Hsing-Chung Liang...”
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  7. 7
    Low-Power Partial-Scan Test with Partial Gating
    by Cing-En Li, 陸慶恩
    Published 2010
    Other Authors: “...Hsing-Chung Liang...”
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  8. 8
    Low-Power Transition Testing in Partial Scan Design
    by Jia-Wei Hu, 胡家瑋
    Published 2009
    Other Authors: “...Hsing-Chung Liang...”
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  9. 9
    An Efficient Design of Deterministic Test Pattern Generator
    by Yan-Fei Tang, 湯燕飛
    Published 2009
    Other Authors: “...Hsing-Chung Liang...”
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  10. 10
    Efficient Deterministic Pattern Generator for Transition Faults Testing
    by Shu-Wei Wu, 吳書緯
    Published 2010
    Other Authors: “...Hsing-Chung Liang...”
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  11. 11
    Enhanced-Scan Test Generation for Both Transition Delay and Stuck-Open Faults
    by Chan-Kuei Chang, 張展魁
    Published 2010
    Other Authors: “...Hsing-Chung Liang...”
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  12. 12
    Parallel ATPG using Multiple Threads
    by Wen-Yi Luo, 羅文益
    Published 2011
    Other Authors: “...Hsing-Chung Liang...”
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  13. 13
    Reducing Many Launch Operations on Flip-flops for Low Power Test Application
    by Chun-Yi Lin, 林俊毅
    Published 2012
    Other Authors: “...Hsing-Chung Liang...”
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  14. 14
    Chain Decision for Low-Power Multiple Scan Testing
    by Cherng-Hann Lee, 李承翰
    Published 2012
    Other Authors: “...Hsing-Chung Liang...”
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  15. 15
    Low Power Testing with Multiple Scan Chains for Transition Delay Faults
    by Qizn-You Zhan, 詹前佑
    Published 2013
    Other Authors: “...Hsing-Chung Liang...”
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  16. 16
    AMBA-Based DFT Design for SoC Chips
    by Chih-Yi Lin, 林智義
    Published 2004
    Other Authors: “...Hsing-Chung Liang...”
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  17. 17
    Improvement on the Process of Searching Repair Solutions
    by Li-Kun Tseng, 曾禮坤
    Published 2005
    Other Authors: “...Hsing-Chung Liang...”
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  18. 18
    Inserting Scan Chains at the Behavioral and Gate Level Description
    by Wei-Cheng Yeh, 葉威震
    Published 2005
    Other Authors: “...Hsing-Chung Liang...”
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  19. 19
    Repairability and Unrepairability Decision for Memories
    by Ming-Chieh Cheng, 鄭明杰
    Published 2003
    Other Authors: “...Hsing-Chung Liang...”
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  20. 20
    A New Design Flow for Generating Low-Power LOC Test Patterns
    by Kun-Yao Huang, 黃琨耀
    Published 2017
    Other Authors: “...Hsing-Chung Liang...”
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