Multi-function Controller for Low-Power Multiple Scan Test of Transition Delay Faults
碩士 === 中原大學 === 電子工程研究所 === 102 === In this thesis,we change the internal structure of scan flip flops by adding four trigates and controlling them with two signals. Scan flip-flops can therefore have the ability of data gating[1] to restore original values or choose values from inputs. We partiton...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3a6y9v |
| Summary: | 碩士 === 中原大學 === 電子工程研究所 === 102 === In this thesis,we change the internal structure of scan flip flops by adding four trigates and controlling them with two signals. Scan flip-flops can therefore have the ability of data gating[1] to restore original values or choose values from inputs. We partiton scan chains into multiple segments and design controller circuits for providing control signals to make only one segment be active during shift, launch, and capture operations for LOC and LOS application for low-power testing transition delay faults. We use the method of Cherng-Wei Leu[13] for grouping flip-flops into segments and generating test patterns accordingly. Experiments show that our designs and testing methods can help achieve the purpose of low-power testing of transition delay faults.
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