Slice Test Data Compression

• Main Author: 林宜民
• Other Authors: 曾王道
• Format: Others
• Language: zh-TW
• Online Access: http://ndltd.ncl.edu.tw/handle/20842753744074826514

碩士 === 元智大學 === 資訊工程學系 === 100 === In traditional testing research for testing VLSI circuits, the larger and larger amounts of test data volume increasing the test time and test cost very much. In this thesis, we proposed an effective compression method to reduce large amounts of test data volume for multiple-scan testing. Different from other compression methods using multiple scan chains, in this method, we not only deal with each slice but also combine the run-length-based technique. There is no need to change the internal structure of CUT, nor do we use a particular algorithm. We use the some traits in each slice like the repeated data between each slice or the repeated data in each slice or specific bits in each slice. Our codeword is quite different. The length of each codeword is not fixed. We will decide the length of each codeword by different traits in each slice. Our hardware structure is simple, only a buffer, a decoder and several counters are needed. We use ISCAS-89 benchmark circuits in our experiment. We can see the experiment results show that our method is especially effective as the circuit size grows.