Slice Test Data Compression
碩士 === 元智大學 === 資訊工程學系 === 100 === In traditional testing research for testing VLSI circuits, the larger and larger amounts of test data volume increasing the test time and test cost very much. In this thesis, we proposed an effective compression method to reduce large amounts of test data volume fo...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/20842753744074826514 |