| Summary: | 碩士 === 國立臺灣大學 === 電機工程學研究所 === 100 === Testing flat panel display source driver ICs is a costly process in manufacture; the root cause is the huge amount of analog measurements and analog access points required to test the internal DAC (digital-to-analog) array.
In this thesis, a scheme for testing source driver ICs is presented with a great gain in time efficiency. We test the open and short defects in a 1,000-channel 8-bit DAC by measuring the current from Gamma voltage source pins. To improve the fault coverage, two DfT techniques are proposed: REF-multiplexer (Reference multiplexer) and FB-multiplexer (Flow back multiplexer). REF-multiplexers enlarge the current deviation from faulty circuit to fault free one, thus we can improve the test accuracy. FB-multiplexer establishes the flow-back current to test open fault. Moreover, rotating pattern scheme is proposed to improve the test parallelism. By concurrent testing, we can test multiple channels in parallel and thus reduce great amount of analog measurement. The validity and the effectiveness of the proposed method are verified by HSPICE simulation.
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