A Design-for-Test Technique for Flat Panel Display Source Driver ICs
碩士 === 國立臺灣大學 === 電機工程學研究所 === 100 === Testing flat panel display source driver ICs is a costly process in manufacture; the root cause is the huge amount of analog measurements and analog access points required to test the internal DAC (digital-to-analog) array. In this thesis, a scheme for testin...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/04014843097208764653 |