Applications of Oxygen Vacancies and Dipole Layer Engineering on SONOS-type Nonvolatile Memory

碩士 === 國立交通大學 === 電子工程系所 === 98 === In this thesis, we utilize oxygen vacancies generated by forming gas anneal (FGA) to our HfO2 thin film and nanocrystal memory capacitors. We find out that HfO2 thin film memory capacitors show the highest hysteresis for FGA temperature of 300oC for 1 hour. And Hf...

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Bibliographic Details
Main Authors: Chu, Po-Chi, 朱柏錡
Other Authors: Chien, Chao-Hsin
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/79612062253799483084