An Efficient Design of Deterministic Test Pattern Generator
碩士 === 中原大學 === 電子工程研究所 === 97 === Build-in self-test (BIST) is very efficient for system-on-chip (SoC) testing. In BIST design, test pattern generators (TPG) are the most important architecture. Pseudo-random pattern generator, e.g. linear feedback shift register (LFSR), is a common TPG. In this th...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/50110580488164924870 |