Yield Analysis with Division of Sections and Redundancy Scheme for DARM
碩士 === 國立交通大學 === 工業工程研究所 === 83 === With the increase in memory density, large chip size, small pattern size, and complicated cell structure, achieving high yield is hindered. Therefore, it is an important issue surrounding the IC industri...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/70188316853130537127 |