Showing 1 - 4 results of 4 for search 'Lee-Ing Tong;Wei-I Lee', query time: 0.06s Refine Results
  1. 1
    The Yield Prediction Model with Neural Network for Integrated Circuit --- Based on Poisson Model
    by Chao, Lee-Chang, 趙豊昌
    Published 1997
    Other Authors: “...Lee-Ing Tong, Wei-I Lee...”
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  2. 2
    The Process Control Procedures for Clustered Defects in IC Fabrication
    by Yang, Yue-Mei, 楊月美
    Published 1996
    Other Authors: “...Lee-Ing Tong, Wei-I Lee...”
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  3. 3
    Yield Analysis with Division of Sections and Redundancy Scheme for DARM
    by Shih Dian Chan, 陳細鈿
    Published 1995
    Other Authors: “...Lee-Ing Tong;Wei-I Lee...”
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  4. 4
    Modified Peocess Control Chart in IC Fabrication -Using Clustering Analysis
    by T.M.Liu, 劉宗明
    Published 1995
    Other Authors: “...Lee-Ing Tong;Wei-I Lee...”
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