Towards large size substrates for III-V co-integration made by direct wafer bonding on Si
We report the first demonstration of 200 mm InGaAs-on-insulator (InGaAs-o-I) fabricated by the direct wafer bonding technique with a donor wafer made of III-V heteroepitaxial structure grown on 200 mm silicon wafer. The measured threading dislocation density of the In0.53Ga0.47As (InGaAs) active lay...
Main Authors: | , , , , , , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2014-08-01
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Series: | APL Materials |
Online Access: | http://dx.doi.org/10.1063/1.4893653 |