Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors
The problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specified operation conditions are given.
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| Format: | Article |
| Language: | English |
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EDP Sciences
2017-01-01
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| Series: | MATEC Web of Conferences |
| Online Access: | https://doi.org/10.1051/matecconf/201712903019 |
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doaj-b5fe229c36044163a6c8d6f6224ccafa2021-08-11T14:29:42ZengEDP SciencesMATEC Web of Conferences2261-236X2017-01-011290301910.1051/matecconf/201712903019matecconf_icmtmte2017_03019Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factorsMakeev MstislavMeshkov SergeySinyakin VladimirThe problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specified operation conditions are given.https://doi.org/10.1051/matecconf/201712903019 |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
Makeev Mstislav Meshkov Sergey Sinyakin Vladimir |
| spellingShingle |
Makeev Mstislav Meshkov Sergey Sinyakin Vladimir Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors MATEC Web of Conferences |
| author_facet |
Makeev Mstislav Meshkov Sergey Sinyakin Vladimir |
| author_sort |
Makeev Mstislav |
| title |
Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors |
| title_short |
Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors |
| title_full |
Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors |
| title_fullStr |
Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors |
| title_full_unstemmed |
Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors |
| title_sort |
prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors |
| publisher |
EDP Sciences |
| series |
MATEC Web of Conferences |
| issn |
2261-236X |
| publishDate |
2017-01-01 |
| description |
The problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specified operation conditions are given. |
| url |
https://doi.org/10.1051/matecconf/201712903019 |
| work_keys_str_mv |
AT makeevmstislav predictionofelectronicnanodevicestechnicalstatusandreliabilitybasedonanalysisoftheirperformanceparameterskineticsundertheinfluenceofexternalfactors AT meshkovsergey predictionofelectronicnanodevicestechnicalstatusandreliabilitybasedonanalysisoftheirperformanceparameterskineticsundertheinfluenceofexternalfactors AT sinyakinvladimir predictionofelectronicnanodevicestechnicalstatusandreliabilitybasedonanalysisoftheirperformanceparameterskineticsundertheinfluenceofexternalfactors |
| _version_ |
1721210859173183488 |