Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors

The problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specified operation conditions are given.

Bibliographic Details
Main Authors: Makeev Mstislav, Meshkov Sergey, Sinyakin Vladimir
Format: Article
Language:English
Published: EDP Sciences 2017-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201712903019