Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors

by Makeev Mstislav, Meshkov Sergey, Sinyakin Vladimir
Published 2017-01-01

Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions

by Makeev Mstislav, Sinyakin Vladimir, Meshkov Sergey
Published 2018-01-01

Prediction of the electrical characteristics of heterostructural microwave devices with transverse current transfer based on a quantum-mechanical self-consistent model of a nanosca...

by Vetrova Natalia, Ivanov Yury, Kuimov Evgeny, Makeev Mstislav, Meshkov Sergey, Pchelintsev Kirill, Shashurin Vasily
Published 2019-01-01