Extrinsic and Intrinsic Frequency Dispersion of High-<em>k</em> Materials in Capacitance-Voltage Measurements
In capacitance-voltage (C-V) measurements, frequency dispersion in high-<em>k</em> dielectrics is often observed. The frequency dependence of the dielectric constant (<em>k</em>-value), that is the intrinsic frequency dispersion, could not be a...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2012-06-01
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| Series: | Materials |
| Subjects: | |
| Online Access: | http://www.mdpi.com/1996-1944/5/6/1005 |