Mechanical characterization of nanostructured thin films at different scales

Mechanical characterization of nanostructured thin films at different scales

The mechanical behaviour of multilayered W/Cu thin films on polyimide substrate has been investigated at different scales and using complementary X-ray techniques and compared to finite element analysis. Mechanical testing has been carried out using a new biaxial tensile machine which allows for...

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Main Authors: Chiron R., Randriamazaoro R.N., Goudeau P., Le Bourhis E., Renault P.O., Geandier G., Thiaudière D., Djaziri S., Castelnau O., Faurie D., Hild F.
Format: Article
Language:English
Published: EDP Sciences 2010-06-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/20100626003
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spelling doaj-ada3e7d5aa8042f4b036d67654cdf97c2021-08-02T17:34:20ZengEDP SciencesEPJ Web of Conferences2100-014X2010-06-0162600310.1051/epjconf/20100626003Mechanical characterization of nanostructured thin films at different scalesChiron R.Randriamazaoro R.N.Goudeau P.Le Bourhis E.Renault P.O.Geandier G.Thiaudière D.Djaziri S.Castelnau O.Faurie D.Hild F.The mechanical behaviour of multilayered W/Cu thin films on polyimide substrate has been investigated at different scales and using complementary X-ray techniques and compared to finite element analysis. Mechanical testing has been carried out using a new biaxial tensile machine which allows for testing in controlled biaxial loading condition. This device has been developed for synchrotron measurements at DiffAbs beamline of the French synchrotron radiation facility (SOLEIL, Saint Aubin). http://dx.doi.org/10.1051/epjconf/20100626003
collection DOAJ
language English
format Article
sources DOAJ
author Chiron R.
Randriamazaoro R.N.
Goudeau P.
Le Bourhis E.
Renault P.O.
Geandier G.
Thiaudière D.
Djaziri S.
Castelnau O.
Faurie D.
Hild F.
spellingShingle Chiron R.
Randriamazaoro R.N.
Goudeau P.
Le Bourhis E.
Renault P.O.
Geandier G.
Thiaudière D.
Djaziri S.
Castelnau O.
Faurie D.
Hild F.
Mechanical characterization of nanostructured thin films at different scales
EPJ Web of Conferences
author_facet Chiron R.
Randriamazaoro R.N.
Goudeau P.
Le Bourhis E.
Renault P.O.
Geandier G.
Thiaudière D.
Djaziri S.
Castelnau O.
Faurie D.
Hild F.
author_sort Chiron R.
title Mechanical characterization of nanostructured thin films at different scales
title_short Mechanical characterization of nanostructured thin films at different scales
title_full Mechanical characterization of nanostructured thin films at different scales
title_fullStr Mechanical characterization of nanostructured thin films at different scales
title_full_unstemmed Mechanical characterization of nanostructured thin films at different scales
title_sort mechanical characterization of nanostructured thin films at different scales
publisher EDP Sciences
series EPJ Web of Conferences
issn 2100-014X
publishDate 2010-06-01
description The mechanical behaviour of multilayered W/Cu thin films on polyimide substrate has been investigated at different scales and using complementary X-ray techniques and compared to finite element analysis. Mechanical testing has been carried out using a new biaxial tensile machine which allows for testing in controlled biaxial loading condition. This device has been developed for synchrotron measurements at DiffAbs beamline of the French synchrotron radiation facility (SOLEIL, Saint Aubin).
url http://dx.doi.org/10.1051/epjconf/20100626003
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AT randriamazaororn mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT goudeaup mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT lebourhise mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT renaultpo mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT geandierg mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT thiaudiered mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT djaziris mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT castelnauo mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
AT fauried mechanicalcharacterizationofnanostructuredthinfilmsatdifferentscales
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