X-ray strain analysis in thin films enhanced by 2D detection

by Chérif S.M., Castelnau O., Djemia P., Le Bourlot C., Renault P.O., Faurie D., Geandier G., Le Bourhis E., Goudeau P.
Published 2010-06-01

Mechanical characterization of nanostructured thin films at different scales

by Chiron R., Randriamazaoro R.N., Goudeau P., Le Bourhis E., Renault P.O., Geandier G., Thiaudière D., Djaziri S., Castelnau O., Faurie D., Hild F.
Published 2010-06-01