Mechanical characterization of nanostructured thin films at different scales
The mechanical behaviour of multilayered W/Cu thin films on polyimide substrate has been investigated at different scales and using complementary X-ray techniques and compared to finite element analysis. Mechanical testing has been carried out using a new biaxial tensile machine which allows for...
Full description
Bibliographic Details
| Main Authors: |
Chiron R.,
Randriamazaoro R.N.,
Goudeau P.,
Le Bourhis E.,
Renault P.O.,
Geandier G.,
Thiaudière D.,
Djaziri S.,
Castelnau O.,
Faurie D.,
Hild F. |
|---|
| Format: | Article
|
|---|
| Language: | English |
|---|
| Published: |
EDP Sciences
2010-06-01
|
|---|
| Series: | EPJ Web of Conferences
|
|---|
| Online Access: | http://dx.doi.org/10.1051/epjconf/20100626003
|
|---|
