ANNEALING EFFECT ON VIBRATION MODES OF ALUMINUM NITRIDE THIN FILMS

Reactive magnetron sputtering was used to prepare aluminum nitride (AlN) films at an intermediate substrate temperature of 450 ºC. In order to analyze the microstructure and vibrational phonon modes of AlxNy and AlmOn clusters, the sample was subjected to thermal annealing in a controlled nitrogen a...

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Bibliographic Details
Main Authors: Roberto Bernal Correa, Mario E. Rodríguez-García, Álvaro Pulzara Mora
Format: Article
Language:English
Published: Universidad Nacional de Colombia 2014-01-01
Series:Momento
Subjects:
Online Access:https://revistas.unal.edu.co/index.php/momento/article/view/48041