X-ray strain analysis in thin films enhanced by 2D detection

X-ray strain analysis in thin films enhanced by 2D detection

Performing a complete in-situ strain measurement of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two dimensional detection is shown to enable relatively f...

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Bibliographic Details
Main Authors: Chérif S.M., Castelnau O., Djemia P., Le Bourlot C., Renault P.O., Faurie D., Geandier G., Le Bourhis E., Goudeau P.
Format: Article
Language:English
Published: EDP Sciences 2010-06-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/20100626008

Internet

http://dx.doi.org/10.1051/epjconf/20100626008

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