Nano-precision metrology of X-ray mirrors with laser speckle angular measurement

A versatile high precision metrology instrument has been developed that surpass the limits of existing metrology techniques and opens up new possibilities to develop next-generation super-polished X-ray mirrors.

Bibliographic Details
Main Authors: Hongchang Wang, Simone Moriconi, Kawal Sawhney
Format: Article
Language:English
Published: Nature Publishing Group 2021-09-01
Series:Light: Science & Applications
Online Access:https://doi.org/10.1038/s41377-021-00632-4