Nano-precision metrology of X-ray mirrors with laser speckle angular measurement

by Hongchang Wang, Simone Moriconi, Kawal Sawhney
Published 2021-09-01

High-energy, high-resolution, fly-scan X-ray phase tomography

by Hongchang Wang, Robert C. Atwood, Matthew James Pankhurst, Yogesh Kashyap, Biao Cai, Tunhe Zhou, Peter David Lee, Michael Drakopoulos, Kawal Sawhney
Published 2019-06-01