Determination of the electric field induced anisotropy change in sub-100 nm perpendicularly magnetized devices

Determination of the electric field induced anisotropy change in sub-100 nm perpendicularly magnetized devices

We measure the voltage or electric field (EF) modulated change in anisotropy using two methods on the same nanometer sized device: 1) Directly using the area of the hard axis magnetization loop and 2) Indirectly using the switching field distribution method. Both methods yield similar values of effi...

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Bibliographic Details
Main Authors: Jiancheng Huang, Michael Tran, Sze Ter Lim, Aihong Huang, Chuyi Yang, Qi Jia Yap, Guchang Han
Format: Article
Language:English
Published: AIP Publishing LLC 2016-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4942822

Internet

http://dx.doi.org/10.1063/1.4942822

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