Role of CoFeB thickness in electric field controlled sub-100 nm sized magnetic tunnel junctions

by James Lourembam, Jiancheng Huang, Sze Ter Lim, Ernult Franck Gerard
Published 2018-05-01

Determination of the electric field induced anisotropy change in sub-100 nm perpendicularly magnetized devices

by Jiancheng Huang, Michael Tran, Sze Ter Lim, Aihong Huang, Chuyi Yang, Qi Jia Yap, Guchang Han
Published 2016-05-01