Impacts of Cu-Doping on the Performance of La-Based RRAM Devices

by Yongte Wang, Hongxia Liu, Xing Wang, Lu Zhao
Published 2019-07-01

Enhanced Electrical Properties of Atomic Layer Deposited LaxAlyO Thin Films with Stress Relieved Preoxide Pretreatment

by Xing Wang, Hongxia Liu, Lu Zhao, Yongte Wang
Published 2018-09-01

Electrical Properties and Interfacial Issues of HfO₂/Ge MIS Capacitors Characterized by the Thickness of La₂O₃ Interlayer

by Lu Zhao, Hongxia Liu, Xing Wang, Yongte Wang, Shulong Wang
Published 2019-05-01

Impacts of the Oxygen Precursor on the Interfacial Properties of LaxAlyO Films Grown by Atomic Layer Deposition on Ge

by Lu Zhao, Hongxia Liu, Xing Wang, Yongte Wang, Shulong Wang
Published 2017-07-01

Improvements on the Interfacial Properties of High-k/Ge MIS Structures by Inserting a La₂O₃ Passivation Layer

by Lu Zhao, Hongxia Liu, Xing Wang, Yongte Wang, Shulong Wang
Published 2018-11-01

Structural Properties Characterized by the Film Thickness and Annealing Temperature for La2O3 Films Grown by Atomic Layer Deposition

by Xing Wang, Hongxia Liu, Lu Zhao, Chenxi Fei, Xingyao Feng, Shupeng Chen, Yongte Wang
Published 2017-03-01