Investigation on the Reliability and Hot Carrier degradation in Advance MOSFET

by Ying-Hsin Lu, 盧頴新
Published 2018

Meridian study on the response current affected by electrical pulse and acupuncture

by Yu-Chiang Hung, Wen-Chung Chen, Ting-Chang Chang, Hao-Xuan Zheng, Yan-Wen Liu, Yung-Fang Tan, Shih-Kai Lin, Ying-Hsin Lu, Wen-Long Hu, Tsung-Ming Tsai
Published 2020-07-01

An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO₂/TiN MOSFETs

by Jih-Chien Liao, Ting-Chang Chang, Wei-Ren Syong, Kai-Chun Chang, Ying-Hsin Lu, Hsi-Wen Liu, Chien-Yu Lin, Li-Hui Chen, Fu-Yuan Jin, Yu-Hsuan Chen, Chen-Hsin Lien, Osbert Cheng, Cheng-Tung Huang, Yi-Han Ye
Published 2018-01-01