An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET

by E Ray Hsieh, Meng-Ru Jiang, Jian-Li Lin, Steve S. Chung, Tse Pu Chen, Shih An Huang, Tai-Ju Chen, Osbert Cheng
Published 2018-01-01

Monitoring of FinFET Characteristics Using <inline-formula> <tex-math notation="LaTeX">$\Delta V_{\text{DIBLSS}}/(I_{\text{on}}/I_{\text{off}})$ </tex-math></inline-formula> and <i...

by Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Chih-Yi Wang, Steven Hsu, Osbert Cheng, Chien-Ting Lin, Yu-Shiang Lin, Zen-Jay Tsai, Ted Wang, Touber Tseng, Chih-Wei Yang, Chin-Yang Hsieh
Published 2019-01-01

Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain

by Shih-Chang Tsai, San-Lein Wu, Jone-Fang Chen, Bo-Chin Wang, Po Chin Huang, Kai-Shiang Tsai, Tsung-Hsien Kao, Chih-Wei Yang, Cheng-Guo Chen, Kun-Yuan Lo, Osbert Cheng, Yean-Kuen Fang
Published 2014-01-01

An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO₂/TiN MOSFETs

by Jih-Chien Liao, Ting-Chang Chang, Wei-Ren Syong, Kai-Chun Chang, Ying-Hsin Lu, Hsi-Wen Liu, Chien-Yu Lin, Li-Hui Chen, Fu-Yuan Jin, Yu-Hsuan Chen, Chen-Hsin Lien, Osbert Cheng, Cheng-Tung Huang, Yi-Han Ye
Published 2018-01-01

Importance of $\Delta V_{{\text {DIBLSS}}}/({I}_{{\text {on}}} /{I}_{{\text {off}}})$ in Evaluating the Performance of n-Channel Bulk FinFET Devices

by Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Steven Hsu, Chun Mao Chiou, Ted Wang, Chih-Wei Yang, Osbert Cheng, Chih-Yi Wang, C. S. Tseng, Ren Huang, Po-Hsieh Lin, Kuan-Yu Lu, I-Fan Chang, Chi-Ju Lee, Yen-Liang Wu, Mike Chang
Published 2018-01-01

A New Figure of Merit, ${\Delta V_{\text {DIBLSS}} /(I_{\rm {d},{\mathrm{ sat}}} /I_{\rm {sd},{\mathrm{ leak}}} )}$ , to Characterize Short-Channel Performance of a Bulk-Si n-Chann...

by Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Steven Hsu, Chun Mao Chiou, Ted Wang, Chih-Wei Yang, Chien-Ting Lin, I-Chang Wang, Ming-Chih Chen, Andy Lai, Pei-Wen Wang, Chia-Jung Hsu, Wen-Yuan Pang, Chin-Hao Kuo, Osbert Cheng, Chih-Yi Wang
Published 2017-01-01