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Muhamad Hatta, S.W
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Muhamad Hatta, S.W
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Impact of different NBTI defect components on sub-threshold operation of high-k p-MOSFET
by
Bukhori, M.F
,
Herman S.H
,
Hussin, H.
,
Muhamad
Hatta
, S.
W
,
Soin, N.
Published 2015
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Related Subjects
Defect mechanisms
Defects
Electronic equipment
Energy profiling approach
Integrated circuits
MOSFET devices
Positive charges
Subthreshold operation
Temperature dependence
Temperature distribution
Thermally activated
Thermoelectric equipment
Threshold elements
Threshold voltage
Threshold voltage shifts
Time exponent
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