Defect mechanisms Defects 1 Electronic equipment 1 Energy profiling approach 1 Integrated circuits 1 MOSFET devices 1 Positive charges 1 Subthreshold operation 1 Temperature dependence 1 Temperature distribution 1 Thermally activated 1 Thermoelectric equipment 1 Threshold elements 1 Threshold voltage 1 Threshold voltage shifts 1 Time exponent 1