Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy

by Paul Monchot, Loïc Coquelin, Khaled Guerroudj, Nicolas Feltin, Alexandra Delvallée, Loïc Crouzier, Nicolas Fischer
Published 2021-04-01

Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology

by Loïc Crouzier, Alexandra Delvallée, Sébastien Ducourtieux, Laurent Devoille, Guillaume Noircler, Christian Ulysse, Olivier Taché, Elodie Barruet, Christophe Tromas, Nicolas Feltin
Published 2019-07-01