Analysis of Anti-JFET for 600V VDMOS and HCI Reliability

by Yang Shao-Ming, Sheu Gene, Lai Chiu-Chung, Deivasigamani Ravi
Published 2018-01-01

Study of HCI Reliability for PLDMOS

by Deivasigamani Ravi, Sheu Gene, Aanand, Wei Lu Shao, Sarwar Imam Syed, Lai Chiu-Chung, Yang Shao-Ming
Published 2018-01-01

An Innovated 80V-100V High-Side Side-Isolated N-LDMOS Device

by Yangi Shao Ming, Sheu Gene, Chien Ting Yao, Wu Chieh Chih, Lee Tzu Chieh, Wu Ching Yuan, Lai Chiu Chung
Published 2018-01-01