Dynamic Performance Characterization Techniques in Gallium Nitride-Based Electronic Devices

by Carlo De Santi, Matteo Buffolo, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Published 2021-08-01

Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect Characteristics

by Matteo Buffolo, Alessandro Magri, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Published 2021-02-01

Excitation Intensity and Temperature-Dependent Performance of InGaN/GaN Multiple Quantum Wells Photodetectors

by Alessandro Caria, Carlo De Santi, Ezgi Dogmus, Farid Medjdoub, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini
Published 2020-11-01

Laser-Based Lighting: Experimental Analysis and Perspectives

by Nicola Trivellin, Maksym Yushchenko, Matteo Buffolo, Carlo De Santi, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni
Published 2017-10-01

Reliability of Blue-Emitting Eu2+-Doped Phosphors for Laser-Lighting Applications

by Matteo Buffolo, Carlo De Santi, Marco Albertini, Donatella Carbonera, Gian Andrea Rizzi, Gaetano Granozzi, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Published 2018-08-01

Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability

by Kalparupa Mukherjee, Carlo De Santi, Matteo Borga, Shuzhen You, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Published 2020-10-01

GaN-Based Laser Wireless Power Transfer System

by Carlo De Santi, Matteo Meneghini, Alessandro Caria, Ezgi Dogmus, Malek Zegaoui, Farid Medjdoub, Boris Kalinic, Tiziana Cesca, Gaudenzio Meneghesso, Enrico Zanoni
Published 2018-01-01

UV-Based Technologies for SARS-CoV2 Inactivation: Status and Perspectives

by Nicola Trivellin, Francesco Piva, Davide Fiorimonte, Matteo Buffolo, Carlo De Santi, Viviana Teresa Orlandi, Fabrizio Dughiero, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Published 2021-07-01

Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p⁺n⁻n Diodes: The Road to Reliable Vertical MOSFETs

by Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo, Matteo Borga, Shuzhen You, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Andrea Gerosa, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Published 2021-04-01

Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization

by Kalparupa Mukherjee, Carlo De Santi, Matteo Borga, Karen Geens, Shuzhen You, Benoit Bakeroot, Stefaan Decoutere, Patrick Diehle, Susanne Hübner, Frank Altmann, Matteo Buffolo, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Published 2021-04-01

Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment

by Alaleh Tajalli, Matteo Borga, Matteo Meneghini, Carlo De Santi, Davide Benazzi, Sven Besendörfer, Roland Püsche, Joff Derluyn, Stefan Degroote, Marianne Germain, Riad Kabouche, Idriss Abid, Elke Meissner, Enrico Zanoni, Farid Medjdoub, Gaudenzio Meneghesso
Published 2020-01-01