Using NI PXI Modules for Digital Signal Processing Microprocessor Testing

by Marfin Vladimir, Nekrasov Pavel, Yanenko Andrey, Schepanov Andrey
Published 2016-01-01

NI Based System for Seu Testing of Memory Chips for Avionics

by Boruzdina Anna, Yanenko Andrey, Tikhomirov Georgy, Tumanov Vitaly
Published 2016-01-01