NI Based System for Seu Testing of Memory Chips for Avionics

by Boruzdina Anna, Yanenko Andrey, Tikhomirov Georgy, Tumanov Vitaly
Published 2016-01-01

Automated Data Processing System for Oscilloscope Measurements during an Environmental Test

by Shmakov Sergey, Cherniak Maxim, Boruzdina Anna, Skorobogatov Peter, Nikiforov Alexander
Published 2016-01-01