Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX

by Egorov Aleksey, Nekrasov Pavel, Kalashnikov Oleg
Published 2016-01-01

Using NI PXI Modules for Digital Signal Processing Microprocessor Testing

by Marfin Vladimir, Nekrasov Pavel, Yanenko Andrey, Schepanov Andrey
Published 2016-01-01

Functional and Parametrical Control of Temperature Sensors with the NI MyRIO Module

by Moskalenko Kirill, Omar Kuandyk, Nekrasov Pavel, Karakozov Andrey, Boychenko Dmitry
Published 2016-01-01