Single nanoparticle-based heteronanojunction as a plasmon ruler for measuring dielectric thin films
Nondestructive, noninvasive and accurate measurement of thin film thicknesses on dielectric substrates is challenging. In this work a ruler for measuring thin film thicknesses utilizes the heteronanojunction construct formed between a plasmonic nanoparticle and a high refractive index nonplasmonic s...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2015-06-18.
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| Subjects: | |
| Online Access: | Get fulltext |