Low cost NBTI degradation detection and masking approaches
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming a great concern for current and future CMOS technology. In this paper, we propose two monitoring and masking approaches that detect late transitions due to NBTI degr...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2013-03.
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| Subjects: | |
| Online Access: | Get fulltext |