Microstructural investigation on the grain refinement occurring in Cu-doped Ni-Ti thin films
The mechanism of grain refinement in Cu-doped Ni-Ti thin films have been investigated by transmission electron microscopy (TEM). Sputter deposited (Ni,Cu)-rich Ni-Ti-Cu thin films exhibited a columnar structure consisting of grains with a decreasing lateral size with increasing Cu content. Cu-rich g...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
2014-04-15.
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| Subjects: | |
| Online Access: | Get fulltext |