Raman microprobe analysis and ageing in dielectrics
Subsurface voids in samples of electrically stressed low density polyethylene (LDPE) were analysed using confocal Raman microprobe spectroscopy (CRMS). An optical depth profiling technique was used to probe a void along the optic axis whilst a burst void was analysed at various lateral positions. Sp...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
2009-09-10.
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| Subjects: | |
| Online Access: | Get fulltext |