Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy

Bibliographic Details
Main Authors:	Kanjanachuchai, S (Author), Tsuchiya, Yoshishige (Author), Usami, K (Author), Oda, S (Author)
Format:	Article
Language:	English
Published:	2004-03-18.
Subjects:	Article
Online Access:	Get fulltext

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