AFM current-imaging study for current density through nanocrystalline silicon dots embedded in SiO2

Bibliographic Details
Main Authors:	Salem, M. A. (Author), Mizuta, Hiroshi (Author), Oda, S. (Author), Fu, Y. (Author), Willander, M. (Author)
Format:	Article
Language:	English
Published:	2005.
Subjects:	Article
Online Access:	Get fulltext

Get fulltext

Similar Items