Thermal-Safe Test Scheduling for Core-Based System-on-a-Chip Integrated Circuits
Overheating has been acknowledged as a major problem during the testing of complex system-on-chip (SOC) integrated circuits. Several power-constrained test scheduling solutions have been recently proposed to tackle this problem during system integration. However, we show that these approaches cannot...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
2005-11.
|
| Subjects: | |
| Online Access: | Get fulltext |