Accurate characterization of wafer bond toughness with the double cantilever specimen

The displacement-loaded double cantilever test, also referred to as the "Maszara test" and the "crack opening method" by the wafer bonding community, is a common technique used to evaluate the interface toughness or surface energy of direct wafer bonds. While the specimen is wide...

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Bibliographic Details
Main Authors: Turner, Kevin Thomas (Author), Spearing, S. Mark (Author)
Format: Article
Language:English
Published: 2008-01-01.
Subjects:
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